EDX, cryogenic device, low vacuum mode, secondary electron detector
backscatter electron detector, STEM (transmission), TEM (transmission electron mikroscope) Type JEOL JEM 1400 Plus
ultramicrotome for making sections.
If you would like to use the electron microscopy equipment, please contact us for detailed information on the terms of use and costs: Dr. Frank Nitsche fnitscheuni-koeln.de
uni-koeln.de